Ic temperature sensor with reference voltages supplied to transistor bases

ABSTRACT

An IC temperature sensor has a reference voltage circuit for providing a reference voltages; a voltage comparing circuit provided with first and second input transistors constructed such that a ratio of sizes of emitters of the first and second input transistors is set to a predetermined ratio; a device for inputting outputs from the reference voltage circuit to the base of the input transistors; a device for providing a predetermined potential for the other input transistor; and a device for outputting a voltage signal proportional to temperature with the difference in size between the emitters of the input transistors.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to an IC temperature sensor for detecting the temperature of an IC chip in a semiconductor integrated circuit (which is called IC in the following description), a power IC for audio, an IC for motor control, etc.

2. Description of the Related Art

A general IC temperature sensor has a simple, but there is about 10% dispersion in temperature coefficient with respect to an obtained voltage in a worst case because of dispersion on in element characteristics.

Japanese Patent Application Laying Open (KOKAI) No. 61-118630 shows a circuit in which the dispersion in element characteristics is considered. However, this circuit has the disadvantage that its output this circuit is changed by a change in the power voltage.

Further, there is a circuit in which there is a difference between the sizes of input transistors to cause a difference in voltage between a base and an emitter of each of the input transistors, thereby obtaining an electric current proportional to temperature. However, this circuit has the disadvantage that it cannot be easily used since its output is provided as an electric current.

SUMMARY OF THE INVENTION

It is therefore an object of the present invention to provide an IC temperature sensor for reducing the influence of dispersion in element characteristics and having a preferable accuracy.

The above object of the present invention can be achieved by an IC temperature sensor comprising a reference voltage circuit for providing reference voltages; a voltage comparing circuit provided with first and second input transistors construted such that the ratio of sizes of emitters of the first and second input transistors is set to a predetermined ratio; means for inputting an output from the reference voltage circuit to at least one of the input transistors; means for providing a predetermined potential for the other input transistor; and means for outputting a voltage signal proportional to temperature in accordance with the difference in size between the emitters of the input transistors.

In the above structure, an output of the reference voltage circuit is inputted to the voltage comparing circuit and a differential voltage is obtained from the difference in size between the first and second input transistors so that an output of the temperature sensor is obtained on the basis of the differential voltage. It is possible to provide a temperature sensor having a good accuracy irrespective of dispersion in element characteristics at a physically determined value by holding an accuracy in output from the reference voltage circuit. Further, a desirable output can be obtained by changing a resistance value and the above size ratio as necessary.

Further objects and advantages of the present invention will be apparent from the following description of the preferred embodiments of the present invention as illustrated in the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1 to 3 are circuit diagrams respectively showing general IC temperature sensors;

FIG. 4 is a circuit diagram showing the basic construction of an IC temperature sensor in the present invention;

FIG. 5 is a characteristic graph showing the relation between temperature and output voltage of the circuit shown in FIG. 4;

FIG. 6 is a circuit diagram showing an IC temperature sensor in accordance with one embodiment of the present invention; and

FIG. 7 is a circuit diagram showing an IC temperature sensor in accordance with another embodiment of the present invention.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

The preferred embodiments of an IC temperature sensor in the present invention will next be described in detail with reference to the accompanying drawings.

FIG. 1 shows a general IC temperature sensor. In FIG. 1, reference numerals Ir₁ and D₁ respectively designate a constant electric current source and a diode. The circuit shown in FIG. 1 uses temperature characteristics about -2 mV/°C. with respect to a voltage V_(BE) between an anode and a cathode of the diode D₁. A voltage proportional to temperature is detected from a connection point between the constant electric current source Ir₁ and the diode D₁.

This circuit can be constructed very simply, but there is about 10% dispersion in temperature coefficient in a worst case because of dispersion in element characteristics.

Japanese Patent Application Laying Open (KOKAI) No. 61-118630 shows a circuit in which the dispersion in element characteristics is considered. As shown in FIG. 2, the circuit of this kind has a transistor Q₁ short-circuited between a base and a collector thereof, and a transistor Q₂ having a base connected to the base of this transistor Q₁. A voltage V_(cc) is applied to the respective collectors of the transistors Q₁ and Q₂ through resistors R₀ and R₂. An emitter of the transistor Q₂ is connected to ground through the resistor R₁. A voltage in accordance with the temperature of the chip is obtained from the collector of the transistor Q₂.

The circuit shown in FIG. 2 uses the results of the following formula (1) with respect to an output voltage V_(out).

    V.sub.OUT =V.sub.CC -I.sub.1 ·R.sub.2 =V.sub.CC -(V.sub.BE1 -V.sub.BE2)R.sub.2 /R.sub.1                               (1)

The following results can be obtained from the above formula (1). ##EQU1##

In the above formula (2), reference numerals K, q, Is, and T respectively designate a Boltzmann constant, an electronic charge, a reverse direction saturation current of a transistor, and an absolute temperature.

As mentioned above, the accuracy of the circuit shown in FIG. 2 is not reduced by the saturation current Is.

However, the circuit shown in FIG. 2 has the disadvantage that the output voltage V_(out) is changed when the voltage V_(cc) is changed.

FIG. 3 shows a circuit structure in which there is a difference between the sizes of input transistors to cause a difference in voltage between a base and an emitter of each of the input transistors, thereby obtaining an electric current proportional to temperature. Namely, in FIG. 3, a transistor Q₁ has a collector and a base short-circuited therebetween and the base of this transistor Q₁ is connected to a base of a transistor Q₂. An electric current I_(T) is supplied to emitters of the transistors Q₁ and Q₂. The collector of the transistor Q₁ is connected to a collector of a transistor Q₃. A transistor Q₄ has a base and a collector short-circuited therebetween and the collector of the transistor Q₄ is connected to a collector of the transistor Q₂. The bases of the transistors Q₃ and Q₄ are connected to each other. An emitter of the transistor Q₃ is connected to that of the transistor Q₄ through a resistor R. The emitter of the transistor Q₃ has an area n-times that of the emitter of the transistor Q₄ where n is a positive integer.

In the circuit shown in FIG. 3, a voltage V_(T) is provided as follows. ##EQU2##

Here, the electric current I_(T) is provided as follows.

    I.sub.T =I.sub.1 +I.sub.2 +2I.sub.1 (∵I.sub.1 =I.sub.2)

Further, from the formula (3), an electric current I₁ is provided as follows. ##EQU3## Accordingly, from these formulas, the electric current I_(T) is represented as follows.

    I.sub.T =2KT/qR 1n n

Therefore, an entire electric current flowing through this circuit is proportional to temperature.

However, the output of this circuit is an electric current so that it is necessary to additionally dispose a circuit for converting the electric current to a voltage.

As mentioned above, the circuit shown in FIG. 2 has the disadvantage that the output voltage of this circuit is changed by the change in voltage V_(cc). Further, the circuit shown in FIG. 3 has the disadvantage that it cannot be easily used since its output is an electric current.

An IC temperature sensor in accordance with each embodiment of the present invention will next be described with reference to FIGS. 4 to 7.

FIG. 4 is a circuit diagram showing the basic construction of an IC temperature sensor in one embodiment of the present invention.

In the present invention, the IC temperature sensor has a reference voltage circuit 1 having two output portions. One output portion O₁ of this reference voltage circuit 1 is connected to one end of a resistor R₁. The other end of this resistor R₁ is connected to a resistor R₂ and a base of a transistor Q₂ as a first input transistor of a differential amplifying circuit 2. An emitter of the transistor Q₂ is connected to one end of a constant electric current source Ir₁ and an emitter of a transistor Q₄ as a second input transistor. The other end of the constant electric current source Ir₁ is connected to a circuit portion having a lowest potential V_(EE). A collector of the transistor Q₂ is connected to a collector and a base of the transistor Q₁ and a base of a transistor Q₃. A collector of the transistor Q₃ is connected to a collector of the transistor Q₄ and a base of the transistor Q₅. Further, emitters of the respective transistors Q₁, Q₃ and Q₅ are connected to a power source having a voltage V_(cc). A collector of the transistor Q₅ is connected to one end of a constant electric current source Ir₂ and a resistor R₂. The other end of the constant electric current source Ir₂ is connected to the circuit portion having potential V_(EE). The other output portion of the reference voltage circuit 1 is connected to a base of the transistor Q₄.

The transistors Q₁ and Q₃ constitute a current mirror and collector currents I₁ and I₂ thereof are equal to each other.

A ratio of the sizes of the emitters of the transistors Q₂ and Q₄ is set to m:n. Reference numeral V_(BE2) designates a voltage between the base and the emitter of the transistor Q₂. Reference numeral V_(BE4) designates a voltage between the base and the emitter of the transistor Q₄. In this case, difference ΔV_(BE) between the voltages V_(BE2) and V_(BE4) is provided as follows. ##EQU4##

In the above formula (5) reference numerals Is₁ and Is₂ respectively designate a reverse direction saturation current of transistor Q₂ and a reverse direction saturation current of transistor Q₄.

The electric current Is₁ is approximately equal to the electric current Is₂ within an integrated circuit.

Here, it is considered that a base potential V₂ of the transistor Q₄ is determined by a reference voltage source so that no change in temperature of this base potential is caused. In this case, a base potential V₃ of the transistor Q₂ is provided as follows from the formula (5). ##EQU5##

An output voltage V_(OUT) can be represented as follows from the formula (6) when an electric current flowing through the base of the transistor Q₂ with respect to an electric current I₃ flowing through the resistor R₁ is neglected. ##EQU6##

If the voltages V₁ and V₂ can be accurately provided, dispersions with respect to ##EQU7## can be respectively reduced and set to about ±3% and ±2 mV in the case of an integrated circuit so that a temperature sensor having high accuracy can be obtained.

Further, the above ratio m:n of the transistors, the voltages V₁, V₂ and the resistors R₁, R₂ can be freely changed as necessary and the power voltage has no influence.

Values R₁ +R₂ /R₁ and n.I_(s2) /m.Is₁ do not depend on temperature. Accordingly, the output voltage V_(out) is linearly changed with respect to temperature from the formula (7) so that the relation between the output voltage and temperature is represented by a straight line having a positive inclination as shown by FIG. 5.

FIG. 6 shows an IC temperature sensor in one concrete embodiment of the present invention. In FIG. 6, the reference voltage circuit 1 shown in FIG. 4 is constructed by a band gap reference circuit. In this reference voltage circuit 1, a power source having a voltage Vcc is connected to ground through a resistor R₃ and diodes D₁ and D₂. A voltage between this resistor R₃ and the diode D₁ is supplied to a base of a transistor Q₆. A collector of the transistor Q₆ is connected to the power source having voltage V_(cc). An emitter of this transistor Q₆ is connected to bases of transistor Q₉ and Q₁₁ and an emitter of a transistor Q₁₂. A collector of the transistor Q₉ is connected to a collector of a transistor Q₈ and a base of a transistor Q₇. A collector of this transistor Q₇ is connected to the ground. An emitter of the transistor Q₉ is connected to the ground through resistors R₄ and R₅. An output voltage partially divided by the resistors R₄ and R₅ is supplied to an emitter of a transistor Q₁₁. An emitter of the transistor Q₈ is connected to the power source having voltage V_(cc). The collector of the transistor Q₈ is connected to an emitter of a transistor Q₁₀. A collector of this transistor Q₁₀ is connected to a collector of the transistor Q₁₁. Further, the collector of the transistor Q₁₁ is connected to a base of a transistor Q₁₂. A base of the transistor Q₁₀ is connected to the power source having voltage V_(cc) through diodes D₃ and D₄ and is connected to the ground through a resistor R₆. An emitter output of the transistor Q₁₂ is provided as a first output O₁. The emitter of the transistor Q₁₂ is connected to the ground through resistors R₇ and R₈. An output divided by these resistors R₇ and R₈ is provided as a second output O₂.

As is well known, the above circuit is constructed such that a voltage about 1.2 V is output as the first output O₁. In this case, the change in output O₁ caused by the change in power voltage, the change in temperature, etc. is reduced and set to about several ten mV. Further, when the second output O₂ is set to an output divided by the above resistors R₇ and R₈, the change in second output O₂ can be reduced and set to a voltage R₇ /R₇ +R₈ times the change in first output O₁.

Instead of the above structure, the first and second outputs O₁ and O₂ of the reference voltage circuit can be the same and the voltages V₁ and V₂ in FIG. 4 can be set equal to each other. Further, it is possible to construct each of the transistors Q₂ and Q₄ shown in FIG. 4 in an input portion of the temperature sensor by a PNP transistor instead of an NPN transistor. These circuits can be generally constructed by the circuit shown in FIG. 7. In FIG. 7, one output O₁ from the reference voltage circuit 1 having two outputs is inputted to a negative terminal "-" of a differential amplifying circuit 2 through a resistor R₁. The other output O₂ of the reference voltage circuit 1 is inputted to a positive terminal "+" of the differential amplifying circuit 2. An output voltage V_(out) of the differential amplifying circuit 2 is connected to the negative input terminal "-" through a resistor R₂ to perform negative feedback.

In the present invention, the ratio of the sizes of first and second input transistors of this differential amplifying circuit 2 is set to a predetermined ratio.

The present invention can be also applied to a temperature sensor providing an output changed at a certain temperature by connecting a comparator to an output section of the temperature sensor.

In accordance with the present invention, it is possible to provide a temperature sensor having a good accuracy since influences of the change in power voltage and dispersion in element characteristics are reduced. Further, all constructional elements can be disposed within an integrated circuit so that no circuit added to the exterior of the temperature sensor is required and space can be effectively utilized in the entire system.

Many widely different embodiments of the present invention may be constructed without departing from the spirit and scope of the present invention. It should be understood that the present invention is not limited to the specific embodiments described in the specification, except as defined in the appended claims. 

What is claimed is:
 1. An IC temperature sensor comprising:a differential amplifying circuit having a first input transistor and a second input transistor, a ratio of sizes of emitters of said first input transistor and said second input transistor being set to a predetermined ratio; a reference voltage circuit for respectively supplying a first reference voltage to a base of said first input transistor and a second reference voltage to a base of said second input transistor such that electric currents flow through the emitters of said first input transistor and said second input transistor; and means for outputting a signal in accordance with a change in temperature by an output voltage generated in said differential amplifying circuit on the basis of said first reference voltage, said second reference voltage, a voltage between the base and the emitter of said first input transistor, a voltage between the base and the emitter of said second input transistor and the predetermined ratio of the sizes of the emitters of said first input transistor and said second input transistor.
 2. An IC temperature sensor according to claim 1, in which said reference voltage circuit has two outputs for supplying said first and second reference voltages and said first reference voltage is supplied to said first input transistor through a first resistor.
 3. An IC temperature sensor according to claim 1, in which an output of said differential amplifying circuit is feedback-connected to said first input transistor through a second resistor.
 4. An IC temperature sensor according to claim 1, in which said output voltage is substantially linearly related to temperature throughout a range of voltage values including the lowest potential in the sensor circuit. 